Sequential test generation with reduced test clocks for partial scan designs.

Soo Young Lee Kewal K. Saluja

Published in: VTS (1994)

Keyphrases

test generation
test cases
test sequences
mutation testing
symbolic execution
design automation
static analysis
software testing
code coverage
quality assurance
test data generation
database
real world
data sets
error rate
cooperative
database systems
information systems
regression testing
machine learning