Soo Young Lee

Publication Activity (10 Years)

Years Active: 1992-2023
Publications (10 Years): 5

Top Topics

Unsupervised Feature Learning

Weakly Supervised

Traffic Accidents

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Soo Young Lee, Choon-Su Park, Keonhyeok Park, Hyung Jin Lee, Seungchul Lee
A Physics-informed and data-driven deep learning approach for wave propagation and its scattering characteristics. Eng. Comput. 39 (4) (2023)
Soo Young Lee, Jiho Chang, Seungchul Lee
Deep Learning-Enabled High-Resolution and Fast Sound Source Localization in Spherical Microphone Array System. IEEE Trans. Instrum. Meas. 71 (2022)
Gyuwon Kim, Soo Young Lee, Jong-Seok Oh, Seungchul Lee
Deep Learning-Based Estimation of the Unknown Road Profile and State Variables for the Vehicle Suspension System. IEEE Access 9 (2021)
Kyung Ho Sun, Hyunsuk Huh, Bayu Adhi Tama, Soo Young Lee, Joon Ha Jung, Seungchul Lee
Vision-Based Fault Diagnostics Using Explainable Deep Learning With Class Activation Maps. IEEE Access 8 (2020)
Soo Young Lee, Bayu Adhi Tama, Changyun Choi, Jong-Yeon Hwang, Jonggeun Bang, Seungchul Lee
Spatial and Sequential Deep Learning Approach for Predicting Temperature Distribution in a Steel-Making Continuous Casting Process. IEEE Access 8 (2020)
Woonsuk Suh, Soo Young Lee, Eunseok Lee
Performance Improvement of Fault Tolerant CORBA Based Intelligent Transportation Systems (ITS) with an Autonomous Agent. NGITS (2009)
Soo Young Lee, Kewal K. Saluja
Test application time reduction for sequential circuits with scan. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14 (9) (1995)
Soo Young Lee, Kewal K. Saluja
Sequential test generation with reduced test clocks for partial scan designs. VTS (1994)
Soo Young Lee, Kewal K. Saluja
Efficient Test Vectors for ISCAS Sequential Benchmark Circuits. ISCAS (1993)
Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee
An Efficient Algorithm for Sequential Circuit Test Generation. IEEE Trans. Computers 42 (11) (1993)
Soo Young Lee, Kewal K. Saluja
An algorithm to reduce test application time in full scan designs. ICCAD (1992)