An algorithm to reduce test application time in full scan designs.
Soo Young LeeKewal K. SalujaPublished in: ICCAD (1992)
Keyphrases
- experimental evaluation
- dynamic programming
- cost function
- learning algorithm
- detection algorithm
- reduce the computational complexity
- computational cost
- np hard
- preprocessing
- computational complexity
- single pass
- optimal solution
- theoretical analysis
- optimization algorithm
- genetic algorithm
- selection algorithm
- recognition algorithm
- times faster
- similarity measure
- computationally efficient
- expectation maximization
- experimental study
- tree structure
- matching algorithm
- simulated annealing
- probabilistic model
- search space
- k means