Test generation for circuits with embedded memories using SMT.

Sarvesh Prabhu Michael S. Hsiao Loganathan Lingappan Vijay Gangaram

Published in: ETS (2013)

Keyphrases

test generation
test cases
symbolic execution
test sequences
design automation
static analysis
quality assurance
embedded systems
test data generation
mutation testing
databases
code coverage
circuit design
regression testing
database applications
high speed
case study
artificial intelligence
machine learning