New Fault Models and Self-Test Generation for Microprocessors Using High-Level Decision Diagrams.
Artjom JasnetskiJaan RaikAnton TsertovRaimund UbarPublished in: DDECS (2015)
Keyphrases
- test generation
- decision diagrams
- high level
- fault models
- model based diagnosis
- digital circuits
- test cases
- multi valued
- markov decision processes
- static analysis
- efficient computation
- quality assurance
- software testing
- fault model
- binary decision diagrams
- fault management
- constraint satisfaction problems
- source code
- data sets
- regular expressions
- planning problems
- horn clauses
- reinforcement learning
- machine learning
- data mining