ROST-C: Reliability driven optimisation and synthesis techniques for combinational circuits.
Satish GrandhiDavid McCarthyChristian SpagnolEmanuel M. PopoviciSorin CotofanaPublished in: ICCD (2015)
Keyphrases
- logic synthesis
- logic circuits
- analog circuits
- asynchronous circuits
- genetic algorithm
- data driven
- neural network
- tunnel diode
- high speed
- delay insensitive
- failure rate
- texture synthesis
- reliability assessment
- quantum computing
- program synthesis
- reliability analysis
- digital circuits
- database
- low power
- heuristic search
- fault diagnosis
- infrared
- data structure
- decision trees
- website
- databases