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Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits.

Chun-Yi KuoChi-Jih ShihYi-Chang LuJames Chien-Mo LiKrishnendu Chakrabarty
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
  • integrated circuit
  • test cases
  • built in self test
  • fault diagnosis
  • fault detection
  • data sets
  • small number
  • model based diagnosis
  • fault model
  • web services
  • software testing
  • electron beam
  • hardware description language