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Statistical Leakage Minimization of Digital Circuits Using Gate Sizing, Gate Length Biasing, Threshold Voltage Selection.
Sarvesh Bhardwaj
Yu Cao
Sarma B. K. Vrudhula
Published in:
J. Low Power Electron. (2006)
Keyphrases
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digital circuits
field effect transistors
leakage current
silicon dioxide
power losses
low voltage
statistical analysis
cmos technology
nano scale
database
objective function
multi agent
statistical models
high density