Test-Suite-Based Analog/RF Test Time Reduction Using Canonical Correlation.
Ke HuangJian WenJim WillmorePublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
- test suite
- test cases
- canonical correlations
- regression testing
- test suite reduction
- software testing
- number of test cases
- mutation testing
- set of test cases
- testing process
- test data
- canonical correlation analysis
- pattern recognition
- discriminant function
- discriminant analysis
- generative model
- feature selection
- object oriented
- high dimensional