Hierarchical Identification of Untestable Faults in Sequential Circuits.

Jaan Raik Raimund Ubar Anna Krivenko Margus Kruus

Published in: DSD (2007)

Keyphrases

fault diagnosis
built in self test
automatic identification
high speed
coarse to fine
fault models
hierarchical model
fault detection
hierarchical clustering
database
test cases
low cost
search algorithm
fault detection and diagnosis
logic synthesis
multiscale
tunnel diode
artificial intelligence