A New Classification of Path-Delay Fault Testability in Terms of Stuck-at Faults.
Subhashis MajumderBhargab B. BhattacharyaVishwani D. AgrawalMichael L. BushnellPublished in: J. Comput. Sci. Technol. (2004)
Keyphrases
- fault diagnosis
- fault detection
- pattern recognition
- classification systems
- classification method
- classification algorithm
- support vector machine
- decision trees
- image classification
- fault model
- text classification
- classification accuracy
- machine learning
- multiple faults
- support vector
- classification scheme
- model selection
- feature space
- feature extraction
- pattern classification
- fault detection and isolation
- benchmark datasets
- support vector machine svm
- training samples
- active learning
- training set