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Simulating Resistive-Bridging and Stuck-At Faults.
Piet Engelke
Ilia Polian
Michel Renovell
Bernd Becker
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
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fault diagnosis
fault detection
multiple faults
model based diagnosis
fault model
probabilistic model
test cases
fault detection and diagnosis
neural network
machine learning
case study
high level
digital divide
abnormal events