A Novel Delay Fault Testing Methodology for Resistive Faults in Deep Sub-micron Technologies.
M. Reza JavaheriReza SedaghatPublished in: CSICC (2008)
Keyphrases
- fault model
- fault diagnosis
- fault detection
- test cases
- multiple faults
- fault injection
- neural network
- fault detection and diagnosis
- fault detection and isolation
- design methodology
- model based testing
- fault isolation
- industrial processes
- real time embedded systems
- fault tree
- model based diagnosis
- fuzzy logic
- expert systems
- normal operation
- discrete event
- data mining