Detectability of CMOS stuck-open faults using random and pseudorandom test sequences.
Sarma SastryMelvin A. BreuerPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
- test sequences
- pseudorandom
- test cases
- mutation testing
- random number
- uniformly distributed
- random numbers
- test generation
- bit rate
- secret key
- video sequences
- image quality
- fault detection
- fault diagnosis
- high speed
- power consumption
- encryption algorithm
- low cost
- stream cipher
- data sets
- low power
- circuit design
- open source
- software testing
- test set
- high quality