Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits.
Toshimasa KuchiiMasaki HashizumeTakeomi TamesadaPublished in: Asian Test Symposium (1996)
Keyphrases
- test generation
- test cases
- symbolic execution
- test sequences
- software testing
- design automation
- static analysis
- mutation testing
- code coverage
- quality assurance
- asynchronous circuits
- regression testing
- databases
- query processing
- cooperative
- database
- specification language
- data model
- test data generation
- logic circuits
- multi agent
- case study