Toshimasa Kuchii

Publication Activity (10 Years)

Years Active: 1996-2007
Publications (10 Years): 0

Publications

Hideyuki Ichihara, Toshimasa Kuchii, Masaaki Yamadate, Hideaki Sakaguchi, Hiroshi Uemura, Kozo Kinoshita
A statistical error model for image sensors and its testing. Systems and Computers in Japan 38 (11) (2007)
Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. J. Electron. Test. 21 (6) (2005)
Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. DELTA (2004)
Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
Reducing Scan Shifts Using Folding Scan Trees. Asian Test Symposium (2003)
Masaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada
Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates. Asian Test Symposium (1997)
Toshimasa Kuchii, Masaki Hashizume, Takeomi Tamesada
Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. Asian Test Symposium (1996)