Shigeki Nishikawa

Publication Activity (10 Years)

Years Active: 2000-2005
Publications (10 Years): 0

Publications

Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. J. Electron. Test. 21 (6) (2005)
Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. DELTA (2004)
Hideyuki Ichihara, Kozo Kinoshita, Koji Isodono, Shigeki Nishikawa
Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. VLSI Design (2003)
Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita
Reducing Scan Shifts Using Folding Scan Trees. Asian Test Symposium (2003)
Yann Antonioli, Tsuneo Inufushi, Shigeki Nishikawa, Kozo Kinoshita
A high-speed IDDQ sensor implementation. Asian Test Symposium (2000)