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Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs.

Hideyuki IchiharaKozo KinoshitaKoji IsodonoShigeki Nishikawa
Published in: VLSI Design (2003)
Keyphrases
  • test data
  • test cases
  • training data
  • small number
  • test set
  • training set
  • training and test data
  • data sets
  • high dimensional
  • software testing