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Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs.
Hideyuki Ichihara
Kozo Kinoshita
Koji Isodono
Shigeki Nishikawa
Published in:
VLSI Design (2003)
Keyphrases
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test data
test cases
training data
small number
test set
training set
training and test data
data sets
high dimensional
software testing