On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits.
Irith PomeranzSudhakar M. ReddyPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
- built in self test
- clustering algorithm
- high quality
- k means
- clustering method
- spectral clustering
- graph theoretic
- cluster analysis
- fault diagnosis
- test cases
- mutation testing
- test generation
- hierarchical clustering
- quality measures
- integrated circuit
- higher quality
- clustering quality
- data mining
- digital circuits
- circuit design
- data points
- fault detection
- categorical data
- data sets
- data clustering
- document clustering
- self organizing maps