Designing Sets of Fault-Detection Tests ror Combinational Logic Circuits.
Zvi KohaviDeWayne A. SpiresPublished in: IEEE Trans. Computers (1971)
Keyphrases
- logic circuits
- fault detection
- low power
- industrial processes
- fault diagnosis
- fault identification
- functional decomposition
- fuel cell
- tennessee eastman
- tunnel diode
- condition monitoring
- failure detection
- robust fault detection
- logic synthesis
- gate array
- fault detection and diagnosis
- fault isolation
- fault localization
- artificial intelligence
- power consumption
- data mining
- neural network
- power dissipation
- fault detection and isolation
- artificial neural networks
- real time