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Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption.

Michiko InoueEmil GizdarskiHideo Fujiwara
Published in: J. Electron. Test. (2002)
Keyphrases
  • test generation
  • test cases
  • symbolic execution
  • logic circuits
  • high speed
  • fault detection
  • asynchronous circuits
  • computational complexity
  • test sequences
  • design automation
  • database systems
  • data model
  • fault diagnosis