March PS(23N) Test for DRAM Pattern-Sensitive Faults.

Vyacheslav N. Yarmolik Yuri V. Klimets Serge N. Demidenko

Published in: Asian Test Symposium (1998)

Keyphrases

test cases
fault diagnosis
main memory
pattern matching
fault detection
test generation
neural network
genetic algorithm
database systems
multi dimensional
pattern detection
abnormal events
multiple faults
mutation testing