Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework.
Fang LiuPlamen K. NikolovSule OzevPublished in: VTS (2006)
Keyphrases
- bayesian framework
- analog circuits
- fault diagnosis
- prior knowledge
- generative model
- neural network
- expert systems
- fault detection
- electronic equipment
- fault detection and diagnosis
- bp neural network
- fuzzy logic
- rotating machinery
- chemical process
- maximum a posteriori
- probability density function
- operating conditions
- multiple faults
- expectation maximization
- monitoring and fault diagnosis
- multi sensor information fusion
- gas turbine
- power transformers
- power plant
- real time
- condition monitoring
- semi supervised
- machine learning