Analog/Digital Testing of Loaded Boards Without Dedicated Test Points.
Christophe VaucherLouis BalmePublished in: ITC (1996)
Keyphrases
- test cases
- test data
- test generation
- software testing
- test sequences
- circuit design
- statistical tests
- test suite
- testing process
- endpoints
- number of test cases
- test case generation
- regression testing
- convex hull
- data points
- data sets
- digital content
- point sets
- low cost
- analog circuits
- digital libraries
- test data generation
- item response theory
- integration testing
- real time