Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits.

Raimund Ubar Sergei Devadze Jaan Raik Artur Jutman

Published in: DELTA (2010)

Keyphrases

fault diagnosis
fault detection
scan path
fault models
multiple faults
fault model
model based diagnosis
expert systems
multiscale
fault detection and isolation
advantages and disadvantages
eye tracking
higher level
input image
object recognition
pattern recognition
data mining