A test approach of combining partial scan with functional testing for high performance processors.
Quanquan LiYingke GaoTiejun ZhangChaohuan HouPublished in: ASICON (2011)
Keyphrases
- test cases
- software testing
- test data
- test generation
- test sequences
- test suite
- testing process
- regression testing
- test case generation
- statistical tests
- distributed memory
- number of test cases
- embedded processors
- multiprocessor systems
- highly parallel
- parallel architecture
- parallel processors
- test data generation
- scan data
- parallel algorithm
- cost effective
- case study
- image processing