Testing Transition Delay Faults in Modified Booth Multipliers.
H.-C. LiangP.-H. HuangY.-F. TangPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
- test cases
- fault model
- fault diagnosis
- software testing
- fault detection
- test data
- mutation testing
- test generation
- model based diagnosis
- hidden markov models
- real world
- software engineering
- dynamic programming
- knowledge base
- information systems
- artificial intelligence
- information retrieval
- machine learning
- root cause
- testing process
- real time