Test set embedding into accumulator-generated sequences targeting hard-to-detect faults.
Ioannis VoyiatzisStelios NeophytouMaria K. MichaelStavros HadjitheophanousCleo SgouropoulouCostas EfstathiouPublished in: IDT (2013)
Keyphrases
- test set
- test cases
- training set
- error rate
- training data
- evaluation methodology
- test data
- class distribution
- detection algorithm
- detection method
- fault diagnosis
- hough transform
- face detector
- hidden markov models
- randomly selected
- random selection
- data sets
- fault detection
- principal component analysis
- video sequences
- computer vision