FACE DETECTOR
Experts
- Stan Z. Li
- Zhen Lei
- Xilin Chen
- Rama Chellappa
- Shiguang Shan
- Wen Gao
- Shifeng Zhang
- Junjie Yan
- Haizhou Ai
- Anil K. Jain
- Muhamad Dwisnanto Putro
- Hazem M. El-Bakry
- Vishal M. Patel
- Kang-Hyun Jo
- Modesto Castrillón Santana
- Chengjie Wang
- Thomas S. Huang
- Chen Change Loy
- Brian C. Lovell
- Guangyou Xu
- Anastasios Tefas
- Ran He
- Xiaobo Wang
- Josef Kittler
- Xiangyu Zhu
- Jian Li
- Shihong Lao
- Olivier Bernier
- Ioannis Pitas
- Yabiao Wang
- Marios Savvides
- Yu Liu
- Xiaoou Tang
- Javier Lorenzo-Navarro
- Daijin Kim
- Peihua Li
- Ying Tai
- Ioannis A. Kakadiaris
- Sébastien Marcel
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- IEEE Access
- CVPR
- Sensors
- ICPR
- FG
- Pattern Recognit. Lett.
- Pattern Recognit.
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICME
- SMC
- IEEE Trans. Instrum. Meas.
- ICCV
- IGARSS
- CVPR Workshops
- Image Vis. Comput.
- Neurocomputing
- IJCNN
- WACV
- ICIP (1)
- ICB
- AVBPA
- ICIP (3)
- FGR
- CCBR
- Int. J. Pattern Recognit. Artif. Intell.
- IEICE Trans. Inf. Syst.
- ACM Multimedia
- Remote. Sens.
- NeuroImage
- ICPR (1)
- BIOSIG
- J. Electronic Imaging
- ISCAS
- IPCV
- ICDIP
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