FACE DETECTOR
Experts
- Stan Z. Li
- Zhen Lei
- Xilin Chen
- Rama Chellappa
- Shiguang Shan
- Shifeng Zhang
- Wen Gao
- Junjie Yan
- Haizhou Ai
- Muhamad Dwisnanto Putro
- Anil K. Jain
- Hazem M. El-Bakry
- Kang-Hyun Jo
- Vishal M. Patel
- Modesto Castrillón Santana
- Chen Change Loy
- Chengjie Wang
- Thomas S. Huang
- Guangyou Xu
- Brian C. Lovell
- Josef Kittler
- Xiangyu Zhu
- Anastasios Tefas
- Ran He
- Xiaobo Wang
- Marios Savvides
- Xiaoou Tang
- Yu Liu
- Javier Lorenzo-Navarro
- Daijin Kim
- Jian Li
- Shihong Lao
- Ioannis Pitas
- Olivier Bernier
- Yabiao Wang
- Jacek Naruniec
- Shengye Yan
- Shuo Yang
- Constantine Kotropoulos
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- IEEE Access
- CVPR
- Sensors
- ICPR
- FG
- Pattern Recognit. Lett.
- Pattern Recognit.
- ICASSP
- ICME
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Instrum. Meas.
- SMC
- ICCV
- IGARSS
- CVPR Workshops
- IJCNN
- Image Vis. Comput.
- Neurocomputing
- WACV
- ICB
- ICIP (1)
- AVBPA
- ICIP (3)
- CCBR
- Int. J. Pattern Recognit. Artif. Intell.
- IEICE Trans. Inf. Syst.
- ACM Multimedia
- FGR
- Remote. Sens.
- NeuroImage
- ICPR (1)
- J. Electronic Imaging
- BIOSIG
- ISCAS
- ICDIP
- ICPR (2)
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