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Experts
- Stan Z. Li
- Zhen Lei
- Xilin Chen
- Rama Chellappa
- Shiguang Shan
- Shifeng Zhang
- Wen Gao
- Haizhou Ai
- Junjie Yan
- Kang-Hyun Jo
- Muhamad Dwisnanto Putro
- Modesto Castrillón Santana
- Anil K. Jain
- Vishal M. Patel
- Hazem M. El-Bakry
- Chen Change Loy
- Chengjie Wang
- Thomas S. Huang
- Guangyou Xu
- Brian C. Lovell
- Xiaobo Wang
- Xiangyu Zhu
- Yu Liu
- Ran He
- Xiaoou Tang
- Daijin Kim
- Yabiao Wang
- Olivier Bernier
- Jian Li
- Javier Lorenzo-Navarro
- Shihong Lao
- Ioannis Pitas
- Anastasios Tefas
- Marios Savvides
- Josef Kittler
- Ying Tai
- Peihua Li
- Shengye Yan
- Sébastien Marcel
Venues
- CoRR
- ICIP
- Multim. Tools Appl.
- CVPR
- IEEE Access
- ICPR
- FG
- Sensors
- Pattern Recognit. Lett.
- Pattern Recognit.
- ICASSP
- ICME
- IEEE Trans. Pattern Anal. Mach. Intell.
- SMC
- ICCV
- CVPR Workshops
- IGARSS
- IEEE Trans. Instrum. Meas.
- Image Vis. Comput.
- Neurocomputing
- IJCNN
- ICIP (3)
- ICB
- AVBPA
- ICIP (1)
- WACV
- IEICE Trans. Inf. Syst.
- FGR
- CCBR
- Int. J. Pattern Recognit. Artif. Intell.
- ACM Multimedia
- NeuroImage
- ICPR (1)
- Remote. Sens.
- BTAS
- ISCAS
- BIOSIG
- IPCV
- EURASIP J. Adv. Signal Process.
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