Multifault and delay-fault testability of multilevel circuits.
Wuudiann KePremachandran R. MenonPublished in: J. Electron. Test. (1995)
Keyphrases
- power dissipation
- fault models
- fault diagnosis
- analog circuits
- fault detection
- fault model
- chip design
- high speed
- neural network
- delay insensitive
- quantum computing
- power consumption
- circuit design
- low power
- cmos technology
- lateral inhibition
- case study
- logic circuits
- logic synthesis
- tunnel diode
- electronic circuits
- test data generation
- digital circuits
- model based diagnosis
- fuzzy logic
- evolutionary algorithm
- expert systems
- information systems