Functional Constraints vs. Test Compression in Scan-Based Delay Testing.
Ilia PolianHideo FujiwaraPublished in: J. Electron. Test. (2007)
Keyphrases
- test cases
- test generation
- software testing
- test data
- test sequences
- test data generation
- image compression
- test suite
- constraint satisfaction
- data compression
- constrained optimization
- integration testing
- statistical tests
- test set
- search space
- scan data
- compression scheme
- usability testing
- regression testing
- neural network
- data structure
- image sequences