Probabilistic fault detection and the selection of measurements for analog integrated circuits.
Zhihua WangGeorges G. E. GielenWilly M. C. SansenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1998)
Keyphrases
- fault detection
- integrated circuit
- fault diagnosis
- fault identification
- industrial processes
- failure detection
- tennessee eastman
- fuel cell
- condition monitoring
- fault localization
- electron beam
- robust fault detection
- printed circuit boards
- hardware description language
- fault detection and diagnosis
- fault isolation
- fault detection and isolation
- power plant
- constraint satisfaction
- computer simulation
- neural network