Exciting Stuck-Open faults in CMOS Circuits Using ILP Techniques.
Fadi A. AloulAssim SagahyroonBashar Al-RawiPublished in: AICCSA (2006)
Keyphrases
- delay insensitive
- analog vlsi
- circuit design
- high speed
- vlsi circuits
- cmos technology
- inductive logic programming
- built in self test
- low power
- fault models
- power dissipation
- floating gate
- fault detection
- fault diagnosis
- chip design
- model based diagnosis
- low voltage
- knowledge base
- random access memory
- relational learning
- asynchronous circuits
- power consumption
- background knowledge
- machine learning
- fault detection and diagnosis
- logic circuits
- leading edge
- multiple faults
- prior knowledge
- real time
- digital circuits