LEADING EDGE
Experts
- Michael Felderer
- Vahid Garousi
- Nikolay Harutyunyan
- Jason L. Frand
- Julia A. Britt
- Kadir Herkiloglu
- Edmond Bianco
- Andrew Sears
- Laurie P. Dringus
- Rudolf Ramler
- Dirk Riehle
- Gary B. Fogel
- Jorge A. Pérez
- Per Runeson
- Brian O'Neill
- Juan Manuel Corchado Rodríguez
- Dietmar Pfahl
- Brian Kingsbury
- William Kent
- Stefan Biffl
- Loet Leydesdorff
- Yen-Shin Lai
- Marley M. B. R. Vellasco
- George Saon
- Sergio Terzi
- Chia-An Yeh
- Emelie Engström
- Bernadette Bouchon-Meunier
- Sergio Rico
- Steve Counsell
- Mika V. Mäntylä
- Katri Valkokari
- John Gehl
- Luca Fanucci
- Jacob Eisenstein
- Christian Bird
- Christopher J. Berry
- Patrick Thomson
- Eunkyoung Lee
Venues
- CoRR
- IEEE Technol. Soc. Mag.
- Commun. ACM
- Scientometrics
- HICSS
- IEEE Softw.
- AMCIS
- IEEM
- Computer
- CSEE&T
- IEEE Comput. Intell. Mag.
- IEEE Ann. Hist. Comput.
- FAST
- SIGCOMM
- IEEE Des. Test Comput.
- SIGCSE
- Sensors
- IBM Syst. J.
- ECIS
- FIE
- Manag. Sci.
- ITC
- IEEE Robotics Autom. Mag.
- IBM J. Res. Dev.
- CBI (1)
- Interfaces
- ICE/ITMC
- AMIA
- J. Inf. Syst. Educ.
- ICIS
- Technol. Anal. Strateg. Manag.
- J. Oper. Res. Soc.
- Comput. Ind.
- Autom.
- XRDS
- ACM SIGSOFT Softw. Eng. Notes
- TAAI
- CASCON
- Int. J. Inf. Manag.
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