LEADING EDGE
Experts
- Vahid Garousi
- Michael Felderer
- Nikolay Harutyunyan
- Jason L. Frand
- Gary B. Fogel
- Jorge A. Pérez
- Kadir Herkiloglu
- Laurie P. Dringus
- Andrew Sears
- Julia A. Britt
- Per Runeson
- Rudolf Ramler
- Dirk Riehle
- Edmond Bianco
- Steve Counsell
- Brian O'Neill
- Juan Manuel Corchado RodrÃguez
- Emelie Engström
- Loet Leydesdorff
- Yen-Shin Lai
- Sergio Rico
- Stefan Biffl
- Marley M. B. R. Vellasco
- William Kent
- Eric Guiffo Kaigom
- Sergio Terzi
- Chia-An Yeh
- Brian Kingsbury
- Dietmar Pfahl
- Bernadette Bouchon-Meunier
- George Saon
- John F. Pitrelli
- Robert L. Franch
- Christopher J. Berry
- Byungtae Lee
- Kristina Lerman
- Cristina Alcaraz
- William I. Gasarch
- Elaine J. Weyuker
Venues
- CoRR
- IEEE Technol. Soc. Mag.
- Scientometrics
- Commun. ACM
- HICSS
- IEEE Softw.
- AMCIS
- Computer
- IEEM
- IEEE Comput. Intell. Mag.
- IEEE Ann. Hist. Comput.
- CSEE&T
- FAST
- Sensors
- SIGCOMM
- SIGCSE
- IEEE Des. Test Comput.
- ECIS
- IBM Syst. J.
- FIE
- IEEE Robotics Autom. Mag.
- IBM J. Res. Dev.
- CBI (1)
- Interfaces
- Manag. Sci.
- ITC
- Technol. Anal. Strateg. Manag.
- IEEE Consumer Electron. Mag.
- ICE/ITMC
- ACM SIGSOFT Softw. Eng. Notes
- ICIS
- J. Inf. Syst. Educ.
- Ind. Manag. Data Syst.
- AMIA
- IEEE Access
- Commun. Assoc. Inf. Syst.
- Interactions
- Comput. Ind.
- CASCON
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