An Area-Efficient Scalable Test Module to Support Low Pin-Count Testing.
Tong-Yu HsiehTai-Ping WangShuo YangChin-An HsuYi-Lung LinPublished in: IEICE Trans. Electron. (2016)
Keyphrases
- test cases
- highly scalable
- lightweight
- computationally expensive
- neural network
- test sequences
- test generation
- metadata
- software testing
- test suite
- model based testing
- database
- memory efficient
- web scale
- learning scenarios
- test data
- decision support
- data streams
- database systems
- artificial intelligence
- genetic algorithm