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Minimizing production test time to detect faults in analog circuits.
Linda S. Milor
Alberto L. Sangiovanni-Vincentelli
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
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analog circuits
fault diagnosis
neural network
digital circuits
test cases
fault detection
detection method
built in self test
wavelet packet transform
automatic detection
expert systems
image restoration
detection algorithm
test data
test suite
signal processing
computer vision