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Acceleration of transition test generation for acyclic sequential circuits utilizing constrained combinational stuck-at test generation.
Tsuyoshi Iwagaki
Satoshi Ohtake
Hideo Fujiwara
Published in:
ETS (2005)
Keyphrases
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test generation
test cases
symbolic execution
design automation
test sequences
quality assurance
static analysis
mutation testing
high speed
np hard
software testing
regression testing
asynchronous circuits
logic circuits
computer vision
case study
test data generation
information systems
machine learning