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Ruddlesden-Popper Faults in NdNiO3 Thin Films.
Chao Yang
Yi Wang
Daniel Putzky
Wilfried Sigle
Hongguang Wang
Roberto A. Ortiz
Gennady Logvenov
Eva Benckiser
Bernhard Keimer
Peter A. van Aken
Published in:
Symmetry (2022)
Keyphrases
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thin film
short circuit
fault diagnosis
fault detection
high density
multiple faults
grain size
fault model
solar cell
test cases
multi layer
model based diagnosis
room temperature
three dimensional
low cost
film thickness
genetic algorithm
white light interferometry