Laboratory X-Ray-Assisted Device Alteration for Fault Isolation and Post-Silicon Debug.
K. C. CelioS. SenE. NisenboimP. M. PardyB. NguyenV. LeW. NoltingS. KumarC. A. PetersonA. RavehK. JohnsonB. StripeF. SuM. LunS. LewisR. I. SpinkW. YunPublished in: IRPS (2024)
Keyphrases
- x ray
- fault isolation
- transmission electron microscopy
- diagnostic tests
- fault detection
- physical systems
- error detection
- fault tolerant
- x ray images
- intraoperative
- fault diagnosis
- medical imaging
- digital x ray images
- fault localization
- tomographic images
- electron microscopy
- three dimensional
- projection images
- high speed
- error correction
- fault tolerance
- high density
- code generation
- error recovery
- fluoroscopic images
- failure detection
- image reconstruction
- complex systems
- distributed systems
- knowledge base