MIX: A Test Generation System for Synchronous Sequential Circuits.
Xijiang LinIrith PomeranzSudhakar M. ReddyPublished in: VLSI Design (1998)
Keyphrases
- test generation
- test cases
- test sequences
- symbolic execution
- mutation testing
- quality assurance
- design automation
- static analysis
- regression testing
- cooperative
- delay insensitive
- software testing
- code coverage
- databases
- monitoring system
- complex systems
- design process
- high speed
- knowledge management
- query processing
- decision trees