A Study of Capture-Safe Test Generation Flow for At-Speed Testing.

Kohei Miyase Xiaoqing Wen Seiji Kajihara Yuta Yamato Atsushi Takashima Hiroshi Furukawa Kenji Noda Hideaki Ito Kazumi Hatayama Takashi Aikyo Kewal K. Saluja

Published in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2010)

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