Metal surface inspection using image processing techniques.

Hon-Son Don King-Sun Fu C. R. Liu Wei-Chung Lin

Published in: IEEE Trans. Syst. Man Cybern. (1984)

Keyphrases

surface inspection
machine vision
quality control
photometric stereo
surface defects
vision system
image processing
light source
grain size
field effect transistors
computer vision
product quality
high temperature
object recognition
training data
face recognition
real time