CMOS Open Fault Detection by Appearance Time of Switching Supply Current.
Masaki HashizumeTetsuo AkitaHiroyuki YotsuyanagiTakeomi TamesadaPublished in: DELTA (2004)
Keyphrases
- fault detection
- fault diagnosis
- industrial processes
- fault identification
- fault detection and diagnosis
- failure detection
- robust fault detection
- low voltage
- power plant
- rotating machinery
- neural network
- low cost
- fuel cell
- tennessee eastman
- artificial intelligence
- fault localization
- fault isolation
- fault detection and isolation
- low power
- search space