Fault-based automatic test generator for linear analog circuits.

Naveena Nagi Abhijit Chatterjee Ashok Balivada Jacob A. Abraham

Published in: ICCAD (1993)

Keyphrases

analog circuits
fault diagnosis
expert systems
neural network
fault detection
fully automatic
data generator
semi automatic
multiple faults
wavelet packet transform
digital circuits
linear systems
fuzzy neural network
test data
test cases
closed form
np complete