Coefficient-based test of parametric faults in analog circuits.

Zhen Guo Jacob Savir

Published in: IEEE Trans. Instrum. Meas. (2006)

Keyphrases

analog circuits
fault diagnosis
test cases
fault detection
digital circuits
neural network
expert systems
wavelet packet transform
built in self test
computer vision
test suite
data mining
high speed
model based diagnosis
mutation testing