A Partial Scan Based Test Generation for Asynchronous Circuits.

Dilip P. Vasudevan Aristides Efthymiou

Published in: DDECS (2008)

Keyphrases

asynchronous circuits
test generation
test cases
test sequences
symbolic execution
design automation
delay insensitive
process algebra
model checking
software testing
static analysis
quality assurance
regression testing
mutation testing
machine learning
object oriented
case study
information systems