Row/column pattern sensitive fault detection in RAMs via built-in self-test.

Manoj Franklin Kewal K. Saluja Kozo Kinoshita

Published in: FTCS (1989)

Keyphrases

fault detection
row column
fault diagnosis
industrial processes
fault identification
built in self test
tennessee eastman
failure detection
fault detection and diagnosis
fuel cell
robust fault detection
power plant
fast fourier transform
integrated circuit
pattern recognition
feature extraction
genetic algorithm