Test Generation for FET Switching Circuits.
J. Paul RothVojin G. OklobdzijaJohn F. BeetemPublished in: ITC (1984)
Keyphrases
- test generation
- tunnel diode
- chip design
- test cases
- test sequences
- symbolic execution
- logic circuits
- design automation
- static analysis
- high speed
- quality assurance
- software testing
- artificial intelligence
- mutation testing
- test data generation
- high density
- open source
- high quality
- computer vision
- power dissipation
- regression testing
- circuit design
- data sets