Enhanced LCCG: A novel test clock generation scheme for faster-than-at-speed delay testing.
Songwei PeiYe GengHuawei LiJun LiuSong JinPublished in: ASP-DAC (2015)
Keyphrases
- high speed
- test cases
- test generation
- software testing
- test data
- test suite
- real time
- test sequences
- detection scheme
- representation scheme
- regression testing
- testing process
- statistical tests
- limit cycle
- item response theory
- test case generation
- code coverage
- memory efficient
- learning scheme
- classification scheme
- training set
- data sets