Test-station for flexible semi-automatic wafer-level silicon photonics testing.
Jeroen De CosterPeter De HeynMarianna PantouvakiBrad SnyderHongtao ChenErik Jan MarinissenPhilippe AbsilJoris Van CampenhoutBryan BoltPublished in: ETS (2016)
Keyphrases
- semi automatic
- fully automatic
- test cases
- gold standard
- semi automatically
- domain ontology
- test data
- software testing
- semantic annotation
- test generation
- ontology mapping
- test suite
- statistical tests
- wrapper generation
- high density
- search engine
- error prone
- testing process
- integrated circuit
- medical images
- high speed
- ground truth
- design rationale
- knowledge base